Equipment
preparation and fabrication
| UVO cleaner | Jelight Company 42A-220 |
| Ultrasonic cleaner | VWR USC-THD |
| Plasma cleaner | |
| Scales | Sartorius TE64, Mettler PE3600 |
| Magnetic hotplate stirrers | VWR VMS-C7, VMS-C4 |
| Centrifuge | Eppendorf 5804 |
| Spin coaters | SPIN150 |
| Bar coater | |
| Slot-die roll coater | developed at Risø DTU |
| Spray-sinter | In-house developed |
| Inkjet printer | Dimatix DMP-2831 |
| Mask aligner | Karl Süss Mask Aligner MJB3 |
| Nanoimprinter | Obducat NIL 2.5 |
| Thermal evaporator | Uvivex 350 |
| Vacuum ovens | JeioTech OV-11 |
characterization
| Potentiostat/Galvanostat | Autolab PGSTAT302 |
| UV/Vis Spectrophotometer | PerkinElmer Lambda 35, Lambda 1050 |
| Fluorescence Spectrometer | PerkinElmer LS45 |
| Luminescence Quantum Yield | Hamamatsu Photonics C9920 |
| Spectrometers | Ocean Optics Flame-S and USB2000 |
| Optical microscope | Olympus BX51 |
| Optical Tensionmeter | Attension Theta |
| Profilometer | Dektak XT, Bruker |
| Atomic force microscope | Park NX-Hivac |
| Source-measure unit | Agilent U2722A, Keithley 4200SCS |
| Luminance meter | Konica Minolta, LS-110 |
| OLED/LEC performance testers | McScience Inc. M6000 PMX; in-house developed VIS/NIR/IR |
| Spectroscopic goniophotometer | In-house developed |
| PV characterization | |
| Thermal camera | FLIR A35sc 9mm |
| Time-Resolved Photoluminescence | Edinburgh FLS1000 |
General equipment and softwares
| Glove boxes | VAC, MecaLab |
| Cryostat | |
| Environmental chamber | Humidity and temperature |
| Optical tables | Various lenses, mirrors etc |
| SETFOS 4.4 | Fluxim AG |
| LabVIEW virtual instrument | National Instruments |
| MATLAB | MathWorks |
| Green solvent tool | In-house developed |